S-3400N binciken lantarki microscope
Alamar sigogi: Item Bayani SE ƙuduri 3.0nm (30kV), High injin yanayi / 10nm (3kV), High injin yanayi BSE ƙuduri 4.0nm (30kV), Low injin yanayi Amp ...
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Alamar sigogi:
Abubuwan | Bayani |
SE ƙuduri | 3.0nm (30kV), High injin yanayi / 10nm (3kV), High injin yanayi |
BSE ƙuduri | 4.0nm (30kV), Low injin yanayin |
Ƙara girma | x5 ~ x300,000 |
hanzarta ƙarfin lantarki | 0.3 ~ 30 kV |
Low injin kewayon | 6 ~ 270 Pa |
Max samfurin size | Diamita 200mm |
Samfurin tebur | nau'in I nau'in II |
X | 0 ~ 80mm 0 ~ 100mm |
Y | 0 ~ 40mm 0 ~ 50mm |
Z | 5 ~ 35mm 5 ~ 65mm |
R | 360o 360o |
T | -20o~ +90o -20o ~ +90o |
T | -20o~ +90o -20o ~ +90o |
Max Sample tsayi | 35mm (WD=10mm) 80mm (WD=10mm) |
Irin direba | Manual biyar axis motor tuki |
fitila | Pre-Pair Tungsten waya |
Object haske Bar | Mai motsawa 4 rami Object Light Bar |
Gun matsin lamba | Fixed rabo bias, hannu bias da kuma atomatik 4 bias |
Mai ganowa | Biyu lantarki detector Babban hankali semiconductor baya yaduwa lantarki detector |
Binciken wuri | WD=10mm, TOA=35o |
sarrafawa | Mouse, maɓallin, maɓallin hannu |
Daidaitawa ta atomatik | Auto waya saturation, Auto 4 batun matsin lamba, Auto gun biyu tsakiya, Auto beam saiti, Auto fusing shaft, Auto mayar da hankali fadewa, Auto haske bambanci |
Cikakken bayani
1. S-3400N yana da karfi atomatik ayyuka, ciki har da atomatik waya saturation, 4 m matsin lamba, atomatik bindiga biyu-biyu, atomatik beam saiti,
Auto fusing shaft atomatik mayar da hankali da kuma fading, atomatik haske bambanci da sauransu.
2. Tabbatar da ƙuduri na 10nm a lokacin da ƙananan ƙarfin lantarki na 3kV.
3. New 5 raba high m semiconductor irin baya yaduwa bincike.
4. S-3400N II iri yana da biyar axis mota tebur, karkata kusurwa iya zuwa -20 digiri ~ + 90 digiri, samfurin iya zuwa 80mm.
Ana iya shigar da EDX, WDX da EBSD a lokaci guda.
6. injin tsarin amfani da turbo kwayoyin famfo, tsabta da inganci
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